S400 Series µHELIX®Test Probes

S400*3800-P2 Group Models
PartNum	Descriptive Model Name	Probe Image	Overall Length	Force
600383	S400*3800/625/30@450/B1300c4/B1300c4		6400µm	30 g
600617	S400*3800/625/30@450/B1300c4/S1300s		6400µm	30 g
600382	S400*3800/625/30@450/B1300c4/S1300r		6400µm	30 g
600823	S400*3800/625/30@450/B1300c4/S1300f		6400µm	30 g
600718	S400*3800/625/30@450/S1300s/S1300s		6400µm	30 g
600824	S400*3800/625/30@450/S1300s/S1300r		6400µm	30 g
600827	S400*3800/625/30@450/S1300s/S1300f		6400µm	30 g
600381	S400*3800/625/30@450/S1300r/S1300r		6400µm	30 g
600825	S400*3800/625/30@450/S1300r/S1300f		6400µm	30 g
600826	S400*3800/625/30@450/S1300f/S1300f		6400µm	30 g
600700	S400*3800/625/30@450/S1900f/S1300s		7000µm	30 g
600675	S400*3800/625/30@450/B1900c4/S1300s		7000µm	30 g
600813	S400*3800/700/100@350/B1300c4/B1300c4		6400µm	100 g
600814	S400*3800/700/100@350/B1300c4/S1300s		6400µm	100 g
600815	S400*3800/700/100@350/B1300c4/S1300r		6400µm	100 g
600816	S400*3800/700/100@350/B1300c4/S1300f		6400µm	100 g
600817	S400*3800/700/100@350/S1300s/S1300s		6400µm	100 g
600818	S400*3800/700/100@350/S1300s/S1300r		6400µm	100 g
600819	S400*3800/700/100@350/S1300s/S1300f		6400µm	100 g
600820	S400*3800/700/100@350/S1300r/S1300r		6400µm	100 g
600821	S400*3800/700/100@350/S1300r/S1300f		6400µm	100 g
600822	S400*3800/700/100@350/S1300f/S1300f		6400µm	100 g
The test probes in group S400*3800-P2 consist of three parts, a body/spring component, a plunger, and a secondary Pin. These test-probes (except for models 600700 and 600675) can be installed with either the Plunger or the secondary pin toward the Device Under Test. The spring is offset toward the plunger end of the tube but functionally, the probes are symmetrical and can be installed with either end down.