| S500*5500-P2 Group | |||||
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| Material: | Probe body (tube and coil component): 304 stainless steel Plunger with sharp, round, flat tip: SS20AP steel Plunger with crown tip: BeCu (Beryllium Copper) Pin2 with sharp, round, flat tip: SS20AP stel Pin2 with crown tip: BeCu (Beryllium Copper) |
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| Lengths: | Probe body (tube/Coil component) Length: 5500 µm (0.217 inch) Plunger Length 1300 µm (0.051 inch) Pin2 Length: 1300 µm (0.051 inch) |
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| Length Overall: | Length Overall (LOA) = 8,10 mm (0.319 inch) | ||||
| Minimum Spacing | 592 µm (0.023 inch) true center-to-center spacing | ||||
| Diameter: | Probe body: 508 µm (0.020 inch) Plunger and Pin2: 356 µm (.014 inch) |
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| Structure: | 3 piece test-probe
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| Spring Force: | 30 grams (1.1 oz) force at 450 µm compression | ||||
| Probe Compliance | MAXIMUM 900 µm (0.035 inch) | RECOMMENDED 450 µm (0.018 inch) | ||||
| Plating | Probe body: 35 µinches Type II (hard) gold Plunger: 35 µinches Type II (hard) gold Pin2: 35 µinches Type II (hard) gold Contact AlphaTest for custom plating. |
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| Lubricant: | no lubricant. Gold to gold contact between Plunger and Tube | ||||
| probe resistance | < 100 milliohms | (Refer to the model specific datasheet) | ||||
| µHELIX® spring life | > 106 cycles of operation at recommended compression | ||||
| Installed Pointing Accuracy | drill accuracy ±20 µm (±0.0008 inch) | ||||
| INSTALLATION NOTES: | |||||
| Install µHELIX®Test-Probes (without receptacles) in a probe-guide block with guide-holes on x,y coordinates corresponding to the DUT contact pad locations. Machine the block from a homogeneous, machinable plastic material such as UltemM®1000 (Polyeherimide), Techtron® (PPS), Ketron PEEK 1000, DELRIN® (Acetel), Torlon® 4203, Pomalux® (SD). Chemical, thermal, and electrical characteristics of these materials can be found in the AlphaTest Tech Note TN0019 or in from your plastic supplier's datasheets. | |||||
| drill sizes | probe-guide: #74; 572 µm (0.0225 inch) plunger-guide: 1/64 inch; 397 µm (0.0156 inch) i/o pin-guide: 1/64 inch or larger (function of fixture design) |
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| guide hole depth | probe body guide: 5500 µm plunger-guide: Function of fixture design i/o pin guide: Function of fixture desigh |
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| Test-Probe Orientation: | S500*5500-P2 Test-Probes can be installed with either end down | ||||
| Test-Probe Removal/Replacement: | Remove test-probes from the guide-block by first removing the i/o PCB or fixture 'Keeper' plate, then pushing test-probe Plunger(s) into the guide-block, and removing the test-probe(s) from the i/o end. NOTE: Do not pull the plunger away from the guide-block nor attempt to pull the test probe out of the guide-block from the plunger end. To clean guide-block (loaded or unloaded) submerse it in clean alcohol in an ultrasonic bath Replace test-probes by loading them into the guide-block and reinstalling the i/o block or fixture 'keeper' plate. |
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* NOTE: These test-probes can be installed with either end toward the Device Under Test. The coil is offset to one end but functionally, test-probes in this group are symmetrical. | ||||
|---|---|---|---|---|
| PartNum | Descriptive Model Name | Plunger Tip Shape | Pin 2 Tip Shape * | Force |
| 600521 | S500*5500/900/30@450/S1300s/S1300s | Sharp | Sharp | 30g |
| 600522 | S500*5500/900/30@450/S1300s/S1300r | Sharp | Round | 30g |
| 600523 | S500*5500/900/30@450/S1300s/S1300f | Sharp | Flat | 30g |
| 600524 | S500*5500/900/30@450/S1300s/B1300c4 | Sharp | Crown | 30g |
| 600525 | S500*5500/900/30@450/B1300c4/S1300r | Crown | Round | 30g |
| 600526 | S500*5500/900/30@450/B1300c4/S1300f | Crown | Flat | 30g |
| 600527 | S500*5500/900/30@450/B1300c4/B1300c4 | Crown | Crown | 30g |
| 600528 | S500*5500/900/30@450/S1300r/S1300r | Round | Round | 30g |
| 600529 | S500*3800/900/30@450/S1300r/S1300f | Round | Flat | 30g |
| 600530 | S500*5500/900/30@450/S1300f/S1300f | Flat | Flat | 30g |
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