| S500*5500-P2 Group Models | ||||
|---|---|---|---|---|
| PartNum | Descriptive Model Name | Probe Image | Length Overall | Force |
| 600521 | S500*5500/900/30@450/S1300s/S1300s | 8100 µm | 30 g | |
| 600522 | S500*5500/900/30@450/S1300s/S1300r | 8100 µm | 30 g | |
| 600523 | S500*5500/900/30@450/S1300s/S1300f | 8100 µm | 30 g | |
| 600524 | S500*5500/900/30@450/S1300s/B1300c4 | 8100 µm | 30 g | |
| 600525 | S500*5500/900/30@450/B1300c4/S1300r | 8100 µm | 30 g | |
| 600526 | S500*5500/900/30@450/B1300c4/S1300f | 8100 µm | 30 g | |
| 600527 | S500*5500/900/30@450/B1300c4/B1300c4 | 8100 µm | 30 g | |
| 600528 | S500*5500/900/30@450/S1300r/S1300r | 8100 µm | 30 g | |
| 600529 | S500*5500/900/30@450/S1300r/S1300f | 8100 µm | 30 g | |
| 600530 | S500*5500/900/30@450/S1300f/S1300f | 8100 µm | 30 g |
| INSTALLATION NOTES: | |
|---|---|
| Install these test-probes with either end toward the Device Under Test. The coil is offset toward the plunger end. The outer body compresses and an equal force is exerted by each end. | |
| Install µHELIX®Test-Probes (without receptacles) in a probe-guide block with guide-holes on x,y coordinates corresponding to the DUT contact pad locations. Machine the block from a homogeneous, machinable plastic material such as UltemM®1000 (Polyeherimide), Techtron® (PPS), Ketron PEEK 1000, DELRIN® (Acetel), Torlon® 4203, Pomalux® (SD). Chemical, thermal, and electrical characteristics of these materials can be found in the AlphaTest Tech Note TN0019 or in from your plastic supplier's datasheets. | |
| drill sizes | probe-guide: #74; 572 µm (0.0225 inch) plunger-guide: 1/64 inch; 397 µm (0.0156 inch) i/o pin-guide: 1/64 inch or larger (function of fixture design) |
| guide hole depth | probe body guide: 5500 µm plunger-guide: Function of fixture design i/o pin guide: Function of fixture desigh |
| Test-Probe Orientation: | S500*5500-P2 Test-Probes can be installed with either end down |
| Test-Probe Removal/Replacement: | Remove test-probes from the guide-block by first removing the i/o PCB or fixture 'Keeper' plate, then pushing test-probe Plunger(s) into the guide-block, and removing the test-probe(s) from the i/o end. NOTE: Do not pull the plunger away from the guide-block nor attempt to pull the test probe out of the guide-block from the plunger end. To clean guide-block (loaded or unloaded) submerse it in clean alcohol in an ultrasonic bath Replace test-probes by loading them into the guide-block and reinstalling the i/o block or fixture 'keeper' plate. |
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