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Testing: ICT/FCT (in circuit test/functional), SoC (System on Chip), BGA (Ball Grid Array), QFN (Quad Flat No Leads)
Testing: medical | automotive| aerospace components | telecommunications
Testing: fine pitch, tight pitch and close centers
Made in the USA, these semiconductor test probes range in diameters from the larger diameter of .020" (.508 mm) down to the smaller diameter of .008" (.203 mm) and are sold globally to the electronics manufacturing industry under the trade name AlphaTest μHELIX® Test-Probes. Meeting the escalating demands of StripLine, BGA, CSP, SoC, SiP, MEMS, mcm, hybrid, RFID antenna, flex-circuit, KGD, and flat-panel testing, these miniature probes define the performance edge in discrete, compliant pogo style test probes by offering wide bandwidth, short electrical length, .010" / 0.254 mm row & column spacing plus four different tip styles. AlphaTest µHELIX® Test-Probes (microHELIX) conform to RoHS and REACH Directives.
AlphaTest Corporation also supplies custom test fixtures, provides training, and shares design concepts with end-users and resellers who incorporate these spring contact probes into their products. We specialize in fast turn proto-typing and are prepared for the frequent revisions associated with custom products.
conforms to RoHS and REACH Directives
* Patent Numbers 5,982,187 and 6,034,532 and 3,165,066. Any other manufacture of these products is prohibited.
|AlphaTest Corporation | 261 Business Park Loop | Shelton, WA 98584 | 360-462-0201 | firstname.lastname@example.org||| Home | Products | FAQ | Contact | Register ||