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Here are our answers to some frequently asked questions about AlphaTest Corporation's MicroHELIX pogo pin probes and test fixtures that offer unparalleled performance, accuracy, and reliability. Our durable MicroHELIX probes have proven to last hundreds of thousands of test cycles, providing long-lasting, accurate, and reliable testing capabilities. Read on to learn more about made-in-the-USA products by AlphaTest Corporation.
Probe Series: | S200 | S300 | S400 | S500 | ||||
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microns | (inches) | microns | (inches) | microns | (inches) | microns | (inches) | |
Probe Diameters: | 200 | (0.008) | 300 | (0.012) | 400 | (0.016) | 500 | (0.020) |
Minimum Centers: | 254 | (0.010) | 363 | (0.0143) | 477 | (0.0188) | 592 | (0.023) |
Minimum wall thickness: | 13 | (0.0005) | 20 | (0.0008) | 20 | (0.0008) | 20 | (0.0008) |
Group ID | Diameter | |
---|---|---|
S500 Series | 500 micron | (0.020") |
S400 Series | 400 micron | (0.016") |
S300 Series | 300 micron | (0.012") |
S200 Series | 200 micron | (0.008") |
S500 Series | Body: μm (inches) | Plunger: μm (") | i/o Pin: μm(") | Overall: mm (") | ||||
---|---|---|---|---|---|---|---|---|
S500*6350-P1 Group | 6350 | (0.250) | 1900 | (0.075) | 8,25 | (0.325) | ||
S500*6350-P2 Group | 6350 | (0.250) | 1900 | (0.075) | 1900 | (0.075) | 10,15 | (0.400) |
S500*5500-P2 Group | 5500 | (0.217) | 1300 | (0.051) | 1300 | (0.051) | 8,10 | (0.319) |
S500*4500-P2 Group | 4500 | (0.177) | 1300 | (0.051) | 1300 | (0.051) | 7,10 | (0.280) |
S500*3800-P1 Group | 3800 | (0.150) | 1300 | (0.051) | 5,10 | (0.201) | ||
S500*3800-P2 Group | 3800 | (0.150) | 1300 | (0.051) | 1300 | (0.051) | 6,40 | (0.252) |
S500*3000-P1 Group | 3000 | (0.150) | 800 | (0.031) | 3,80 | (0.181) | ||
S500*2440-P1 Group | 2440 | (0.096) | 610 | (0.024) | 3,05 | (0.120) |
S400 Series | Body: μm (inches) | Plunger: μm (") | i/o Pin: μm(") | Overall: mm (") | ||||
---|---|---|---|---|---|---|---|---|
S400*6350-P1 Group | 6350 | (0.250) | 1900 | (0.075) | 8,25 | (0.325) | ||
S400*6350-P2 Group | 6350 | (0.250) | 1900 | (0.075) | 1900 | (0.075) | 10,15 | (0.400) |
S400*4500-P2 Group | 4500 | (0.177) | 1300 | (0.051) | 1300 | (0.051) | 7,10 | (0.280) |
S400*3800-P1 Group | 3800 | (0.150) | 1300 | (0.051) | 5,10 | (0.201) | ||
S400*3800-P2 Group | 3800 | (0.150) | 1300 | (0.051) | 1300 | (0.051) | 6,40 | (0.252) |
S400*2440-P1 Group | 2440 | (0.096) | 610 | (0.024) | 3,05 | (0.120) |
S300 Series | Body: μm (inches) | Plunger: μm (") | i/o Pin: μm(") | Overall: mm (") | ||||
---|---|---|---|---|---|---|---|---|
S300*3800-P1 Group | 3800 | (0.150) | 1300 | (0.051) | 5,10 | (0.201) | ||
S300*2300-P1 Group | 2300 | (0.091) | 1000 | (0.039) | 3,30 | (0.130) | ||
S300*2050-P1 Group | 2050 | (0.081) | 450 | (0.018) | 2,66 | (0.105) |
S200 Series | Body: µm (inches) | Plunger: µm (") | i/o Pin: µm (") | Overall: mm (") | ||||
---|---|---|---|---|---|---|---|---|
S200*3800-P1 Group | 3800 | (0.150) | 1300 | (0.051) | 5,10 | (0.201) | ||
S200*2300-P1 Group | 2300 | (0.091) | 1000 | (0.039) | 3,30 | (0.130) | ||
S200*2300-P2 Group | 2300 | (0.091) | 1000 | (0.039) | 1000 | (0.039) | 4,30 | (0.169) |
Categories (Cat): (1) standard, (2) custom, (3) special Construction (Const) Device Under Test (DUT) contact description: Plunger, tube end input/output (i/o) end description: i/o Pin, wire, tube end Pin Tip Shapes: sharp (s), radiused (r), flat (f), 4-point crown (c4) AlphaTest μHELIX tube&spring assembly (probe body) Diameter (ø) |
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Cat | Const | DUT contact> | i/o contact | + Features | Description | Drawing |
1 | 2-piece | plunger | annular | Basic μHELIX | probe body; plunger (s,r,f,c4) |
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1 | 3-piece | plunger | i/o pin | secondary pin | probe body; plunger (s,r,f,c4); i/o Pin (s,r,f,c4) |
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2 | 3-piece | plunger | i/o wire | i/o wire | probe body; plunger (s,r,f,c4); wire installed at i/o end |
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1 | 2-piece | plunger | i/o pin | capture feature | probe body; reduced ø at i/o end; plunger (s,r,f,c4) | ![]() |
2 | 1-piece | annular | annular | transposer | probe body | ![]() |
3 | 1-piece | annular | annular | capturable transposer | probe body; reduced ø at one end |
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2 | 1-piece | annular | annular | capturable transposer | probe body; reduced ø at both ends |
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2 | 2-piece | annular | annular | low resistance, captured transposer | probe body; reduced ø at both ends; internal Cu wire for high conductivity |
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2 | 2-piece | plunger | crown | short, i/o crown | probe body; crown at i/o end; plunger (s,r,f,c4) |
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2 | 2-piece | plunger | crown | short, captured i/o crown | probe body; crown at i/o end; reduced ø at i/o end; Plunger (s,r,f,c4) |
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3 | Custom | Custom | Custom | Custom | Custom |
Example: Drill cutting-speed vs Drill Size using 10,000 rpm cutting-speed in units/time = PI*(Dia in units)*(rpm)/(60 sec/min) |
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Drill Size | Cutting Speed | Application | ||||
microns | inches | mm/sec | inches/sec | guide-hole for: | ||
#74 | 572 | (0.0225) | 300 | (11.8) | S500 probe body | |
1/64" | 397 | (0.0156) | 208 | (8.2) | S500 plunger | i/o pin | |
#77 | 457 | (0.018) | 239 | (9.4) | S400 probe body | |
#80 | 343 | (0.0135) | 180 | (7.1) | S400 plunger | i/o pin | |
S300 probe body | ||||||
#88 | 240 | (0.0955) | 126 | (5.0) | S300 plunger | i/o pin | |
S200 probe body | ||||||
#96 | 160 | (0.0063) | 84 | (3.3) | S200 plunger | i/o pin |
Lead (Pb) | Polybrominated Diphenyl Ethers (PBDE) | |
Mercury (Hg) | Bis(2-ethylhexyl)phthalate (DEHP) | |
Cadmium (Cd) | Benzyl Butyl Phthalate (BBP) | |
Hexavalent Chromium (Cr VI) | Dibutyl Phthalate (DBP) | |
Polybrominated Biphenyls (PBB) | Diisobutyl Phthalate (DIBP) |
AlphaTest Corporation | 261 W Business Park Loop | Shelton, WA 98584 | 360-462-0201 | info@alphatest.com | | Home | Products | FAQ | Contact | Register |