microHELIX Test Probes your fine-pitch connection

 

µHELIX®

 

 

S400*4500-P2 Group Models
PartNum Descriptive Model Name Probe Image Length
Overall
Force
600509 S400*4500/900/30@450/B1300c4/B1300c4 model 600509 7100 µm30 g
600510 S400*4500/900/30@450/B1300c4/S1300r model 600510 7100 µm30 g
600511 S400*4500/900/30@450/B1300c4/S1300s model 600511 7100 µm30 g
600512 S400*4500/900/30@450/B1300c4/S1300f model 600512 7100 µm30 g
600513 S400*4500/900/30@450/S1300r/S1300r model 600513 7100 µm30 g
600514 S400*4500/900/30@450/S1300r/S1300s model 600514 7100 µm30 g
600515 S400*4500/900/30@450/S1300r/S1300f model 600515 7100 µm30 g
600516 S400*4500/900/30@450/S1300s/S1300s model 600516 7100 µm30 g
600517 S400*4500/900/30@450/S1300s/S1300f model 600517 7100 µm30 g
600518 S400*4500/900/30@450/S1300f/S1300f model 600518 7100 µm30 g
600674 S400*4500/900/30@450/S1300(±13µm)r/S1300r model 600674 7100 µm30 g
 
600719 S400*4500/900/80@450/S1300r/S1300s model 600719 7100 µm80 g
600876 S400*4500/900/80@450/S1300r/S1300r model 600876 7100 µm80 g
NOTE: The test-probes in this group can be installed with either end toward the Device Under Test. The spring-coil is offset to one end but the probes deliver symmetrical compression and force.

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