AlphaTest Corporation microHELIX Test-Probes your fine-pitch connection

HELIX®

Test Probes for fine-pitch applications: CSP, BGA, SiP, SoC, flex-circuits, micro pcb, sub-mm center-to-center spacing, half mm, quarter mm spacing. Excellent for use in sockets, fixtures, and contactors for semiconductor testing and in coaxial installations.

Probe Groups

Data Sheets
Scaled Image Diameter Minimum Centers Body Length Plunger Length Pin2 Length Length Overall
µminch µminch µminch µminch µminch µminch
S500 Groups S500 Scale  
S500*2440-P1 600354 508 (.020) 592 (.023) 2440 (.096) 610 (.024)   3050 (.120)
S500*3800-P1 600262 508 (.020) 592 (.023) 3800 (.150) 1300 (.051)   5100(.201)
S500*4500-P2 600337 508 (.020) 592 (.023) 4500 (.177) 1300 (.051) 1300 (.051) 7100 (.280)
S500*6350-P1 600280 508 (.020) 592 (.023) 6350 (.250) 1900 (.075)   8250 (.325)
S500*6350-P2 600406 508 (.020) 592 (.023) 6350 (.250) 1900 (.075) 1900 (.075) 10150 (.400)
S500*6600-P1 600793 508 (.020) 592 (.023) 6600 (.260) 3800 (.150)   10400 (.409)
S400 Groups S400 Scale  
S400*3800-P1 600226 406 (.016) 477 (.0188) 3800 (.150) 1300 (.250)   5100 (.201)
S400*4500-P2 600516 406 (.016) 477 (.0188) 4500 (.177) 1300 (.051) 1300 (.051) 7100 (.280)
S400*6350-P1 600244 406 (.016) 477 (.0188) 6350 (.250) 1900 (.075)   8250 (.325)
S400*6350-P2 600788 406 (.016) 477 (.0188) 6350 (.250) 1900 (.075) 1900 (.075) 10150 (.400)
S300 Groups S300 Scale  
S300*2300-P1 600190 304 (.012) 363 (.0143) 2300 (.091) 1000 (.150)   3300 (.130)
S300*3800-P1 600208 304 (.012) 363 (.0143) 3800 (.150) 1300 (.051)   5100 (.201)
S300*3800-P2 600806 304 (.012) 363 (.0143) 3800 (.150) 1300 (.051) 1300 (.051) 6400 (.252)
S200 Groups S200 Scale  
S200*2300-P1 600154 203 (.008) 254 (.010) 2300 (.091) 1000 (.039)   3300 (.130)
S200*2300-P2 600812 203 (.008) 254 (.010) 2300 (.091) 1000 (.039) 1000 (.039) 4300 (.169)
S200*3800-P1 600172 203 (.008) 254 (.010) 3800 (.150) 1300 (.051)   5100 (.201)