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AlphaTest µHELIX^® Test Probes

Series S200, S300, S400, and S500 Series fine-pitch, spring-loaded, compliant, electrical contact probes

Test Probes for fine-pitch applications: CSP, BGA, SiP, SoC, flex-circuits, micro pcb, sub-mm center-to-center spacing, half mm, quarter mm spacing. Excellent for use in sockets, fixtures, and contactors for semiconductor testing and in coaxial installations.

Probe Groups Data Sheets	Scaled Image	Diameter		Minimum Centers		Body Length		Plunger Length		Pin2 Length		Length Overall
		µm	inch	µm	inch	µm	inch	µm	inch	µm	inch	µm	inch
S500 Groups
S500*2440-P1		508	(.020)	592	(.023)	2440	(.096)	610	(.024)			3050	(.120)
S500*3800-P1		508	(.020)	592	(.023)	3800	(.150)	1300	(.051)			5100	(.201)
S500*4500-P2		508	(.020)	592	(.023)	4500	(.177)	1300	(.051)	1300	(.051)	7100	(.280)
S500*6350-P1		508	(.020)	592	(.023)	6350	(.250)	1900	(.075)			8250	(.325)
S500*6350-P2		508	(.020)	592	(.023)	6350	(.250)	1900	(.075)	1900	(.075)	10150	(.400)
S500*6600-P1		508	(.020)	592	(.023)	6600	(.260)	3800	(.150)			10400	(.409)
S400 Groups
S400*3800-P1		406	(.016)	477	(.0188)	3800	(.150)	1300	(.250)			5100	(.201)
S400*4500-P2		406	(.016)	477	(.0188)	4500	(.177)	1300	(.051)	1300	(.051)	7100	(.280)
S400*6350-P1		406	(.016)	477	(.0188)	6350	(.250)	1900	(.075)			8250	(.325)
S400*6350-P2		406	(.016)	477	(.0188)	6350	(.250)	1900	(.075)	1900	(.075)	10150	(.400)
S300 Groups
S300*2300-P1		304	(.012)	363	(.0143)	2300	(.091)	1000	(.150)			3300	(.130)
S300*3800-P1		304	(.012)	363	(.0143)	3800	(.150)	1300	(.051)			5100	(.201)
S300*3800-P2		304	(.012)	363	(.0143)	3800	(.150)	1300	(.051)	1300	(.051)	6400	(.252)
S200 Groups
S200*2300-P1		203	(.008)	254	(.010)	2300	(.091)	1000	(.039)			3300	(.130)
S200*2300-P2		203	(.008)	254	(.010)	2300	(.091)	1000	(.039)	1000	(.039)	4300	(.169)
S200*3800-P1		203	(.008)	254	(.010)	3800	(.150)	1300	(.051)			5100	(.201)