microHELIX Test Probes your fine-pitch connection

µHELIX®

 

 

S200*2300-P2 Group
PartNum Descriptive Model Name
Diameter*Length/ΔMax/force@ΔNorm/Plunger/Pin2
Probe Image Length
Overall
Force
600682 S200*2300/300/30@150/B1000c4.Au/B1000c4.Au model 600682 4300µm30 g
600828 S200*2300/300/30@150/B1000c4.Au/S1000s.Au model 600828 4300µm30 g
600829 S200*2300/300/30@150/B1000c4.Au/S1000r.Au model 600829 4300µm30 g
600830 S200*2300/300/30@150/B1000c4.Au/S1000f.Au model 600830 4300µm30 g
600812
S200*2300/300/30@150/S1000s.Au/S1000s.Au model 600812 4300 µm30 g
600831
S200*2300/300/30@150/S1000s.Au/S1000r.Au model 600831 4300 µm30 g
600755 S200*2300/300/30@150/S1000s.Au/S1000f.Au model 600755 4300 µm30 g
600601 S200*2300/300/30@150/S1000r.Au/S1000r.Au model 600601 4300µm30 g
600832 S200*2300/300/30@150/S1000r.Au/S1000f.Au model 600832 4300 µm30 g
600833 S200*2300/300/30@150/S1000f.Au/S1000f.Au model 600833 4300 µm30 g
INSTALLATION NOTE: S200*2300-P2 Group test-probes can be installed with either end toward the Device Under Test. The spring-coil is offset to one end but functionally, test-probes in this group are symmetrical.

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